Pioneer in Nano-Metrology COXEM, SEM, SPM, Confocal, X-Ray Analysis

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Scanning Electron Microscope

Versatile Tool to Access the Nano-World.
The electron microscope is the most commonly used tool in surface metrology and it is widely used in educational programs, R&D and quality control.

Scanning Probe Microscope

Evolution of Atomic Force Microscope
SPM covers the full range scanning probe microscopy techniques to investigate the surface properties like as topography, electronic, magnetic characteristics from nano-scale to several tens of micron

Confocal Laser Scanning Microscope

VConfocal Laser Scanning Microscopy is a optical 3-dimensional surface profiler with a high-resolution. With a high numerical aperture objective lens (up to 0.95) and a shorter wavelength laser provide a high-resolution imaging along both the optical and transverse direction.

X-Ray Fluorescence Spectroscope

XRF(X-ray Fluorescence Spectroscope) is the emission of characteristic "Secondary" (or fluorescent) X-rays from a material that has been excited by bombarding with high-energy X-rays or gamma ray. The phenomenon is widely used for elemental analysis and chemical and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials.