SPM covers the full range scanning probe microscopy techniques to investigate the surface
properties like as topography, electronic, magnetic characteristics from nanoscale to several
tens of micron. The state- of-the-art DSP-based fast digital controller provides not only much
easy and flexible operational interface but also sufficient high speed/resolution imaging
solution. Also, our system provides very versatile Ethernet-based remote control of the SPM
instrument. Advance nanolithography tool supports the very convenient interface as well as
various probe-based writing techniques.