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iEDX-200AT is an instrument the finds film thickness layers based on fluorescent X-ray intensity data obtained by exposing a sample to X-ray irradiation. Typically calibration method is applied using standard material. When sample is analytically uniform, the composition can be calculated from FP. Additional function is hazard material screening for RoHS, WEEE, ELV Compliance
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| What is X-ray coating thickness measurement system? |
Because the amount of discharged when X-ray is radiated on coating part has interrelation with material¨s thickness, the thickness is measured by using the below material¨s fluorescent X-ray excited or absorbed at the below material and coating thickness.
X-ray fluorescence of coating layer, Flurescent X-ray detected at the bottom of the metal is a principle.
It is unified productm which can measure coating thickness, analyzes hazardous material, and analyzes heavy metal. Its analysis range is K~U and can analyze up to 5 plating layer with 0.01 Л thickness resolution.
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Analyze Method
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， Calibration Method using thickness standard
， Fundamental Parameter using unknown sample
， Qualitative/Quantitative Analysis
， Single/Multilayer Analysis
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Application
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， Non-Destructive thickness gauge PCB, Wire, Electric Device
， Plating Thickness gauge
， Jewelry, Accessories, Toy Hazard material Screening
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Specification
| Measurement Method |
Energy Dispersive X-ray Analysis |
| Sample type |
Multi-layer, Solid/Liquid/Powder |
| X-ray Tube |
W Target, 50 kVp 1 mA |
| Detection System |
Si-Pin Diode (Peltier System) |
| Energy Resolution |
149 eV FWHM at Mn Kメ |
| Detection Element |
Al (13) ~ U (92) |
| Analyze Methods |
FP/Calibration Curve, Absorption, Fluorescence |
| Sample Monitoring |
2 Stage CCD Camera |
| Sample Area |
500 x 470 x 200 mm (WxDxH) |
| Stage Movement |
200 x 200 x 150 mm (X, Y, Z) |
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