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Description

SELPA(Scanning ELectron Microscope for Particle Analysis) is an automated large area particle analyzer, which is developed based on SEM(Scanning Electron Microscope)

In industrial application, it can be used to analyze and classify the particles by their various size and element, the strength of SELPA is that the large area mapping is possible. Also, SELPA can analyze particles under 2.5um, it's a SEM/EDS automated system which can get the results of elements distribution of selected area. 


Applications

- Cleanliness Test

- Steel Inclusion Test 

- GSR (Gun Shot Residue) Analysis

- Mineral, Asbestos Analysis

- Particle Analysis 



 

Electron GunPre-centered Cartridge
SourceTungsten (W)
Magnification x60 to x5,000
Acceleration Voltage1 to 30kV (1kV increment)
Vacuum ModeVariable Pressure (10Pa, 20Pa, 40Pa, 60Pa)
DetectorBSED(DP)
Stage X: 100mm (Motorized)
Y: 100mm (Motorized)
Z: 12 to 40mm (Motorized)
Chamber Size220mm in diameter
Maximum Sample Size 100mm in diameter
Maximum Sample Height28mm
GUINanoStation 4.1
Auto Image AdjustmentAuto Focus (New algorism)
Real Time Auto B/C (Normalized algorism)
One click Auto B/C
Vacuum SystemTurbo Pump
Rotary Pump
MFC (VP control)
Special FeatureChamber View Camera
Quadriad Membrane Filter Specimen Stage
Multiple Pin Stub Specimen Stage
EDSOxford / Bruker
EDS OptionClean / Steel / GSR / Mineral

Optional Products

  • 게시물이 없습니다.

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