Inquiry
Member
한국어
Description
a high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range. After evaluating the EM-30 Series your search will be over to find the best compact SEM available.
Applications
Specifications
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EM-30 |
EM-30AX |
|---|---|---|
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Magnification |
15-150,000X |
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Spatial Resolution |
<5nm at 30kV |
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Acceleration Voltage |
1 - 30kV (adjustable in 1kV scale) |
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Electron Source |
Pre-Centered Tungsten Filament |
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Detector |
SED(DP) |
SED(DP), EDS |
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Sample Size |
70mm (W) x 45mm (H) |
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X-Y/T Traverse |
35x35mm / 0 - 45º |
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Features |
Measurement Tool Remote Control |
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Automation |
Focus, Filament, Brightness/Contrast |
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Data Output Format |
jpg, tiff, BMP |
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Dimensions |
400 x 600 x 550 mm |
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Weight |
85 kgs |
95 kgs |
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Options |
BSED CoolStage |
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30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included) |
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Optional Products
#201, Migun Techno World 1-cha, 199, Techno2-ro, Yuseong-gu, Daejeon, Korea, 34025
TEL : +82-42-861-1686 FAX : +82-42-861-1689
MAIL : (OVERSEAS) overseas@coxem.com
(DOMESTIC) domestic@coxem.com
(CUSTOMER SERVICE) customerservice@coxem.com
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