Description
a high-resolution Tabletop Scanning Electron Microscope (SEM) with specifications and capabilities not matched by any other SEM in its price range. After evaluating the EM-30 Series your search will be over to find the best compact SEM available.
Applications
Specifications
|
EM-30 |
EM-30AX |
---|---|---|
Magnification |
15-150,000X |
|
Spatial Resolution |
<5nm at 30kV |
|
Acceleration Voltage |
1 - 30kV (adjustable in 1kV scale) |
|
Electron Source |
Pre-Centered Tungsten Filament |
|
Detector |
SED(DP) |
SED(DP), EDS |
Sample Size |
70mm (W) x 45mm (H) |
|
X-Y/T Traverse |
35x35mm / 0 - 45º |
|
Features |
Measurement Tool Remote Control |
|
Automation |
Focus, Filament, Brightness/Contrast |
|
Data Output Format |
jpg, tiff, BMP |
|
Dimensions |
400 x 600 x 550 mm |
|
Weight |
85 kgs |
95 kgs |
Options |
BSED CoolStage |
|
30mm Active Size Compact Type EDS (Particle Analysis) 30mm Active Size Compact Type EDS (MPO included) |
|
Optional Products